AI-Driven Counterfeit Detection and Legacy Parts Identification for Enhanced Military Readiness TACFI
AFWERX · AFWERX TACFI · AFWERX
Award
Description
Leveraging the core-underlying technology of One Click Capture, EMPEQ is proposing a solution that uses machine learning to identify electronic parts through a secure handheld device such as an iPhone, iPad, tablet, or Android. This same technology would use Computer Vision Artificial Intelligence/Machine Learning (“AI”/”ML”) to “see” what part the Warfighter is focusing on. Once the part or component is successfully identified, AI/ML models will be utilized to run virtual tests to see if the part is counterfeit. Also, once identified, utilizing existing government (GSA) and commercially available part libraries, the technology will maintain the capability to provide additional information about the part or component to include country of origin, chain of custody, provide RMA data, lifecycle date, identification of sub-items, Bill of Materials (BOM) risk assessments, place and year of manufacture, suggested life time, warranty information, servicing, and where to order a replacement.